Subpixel measurement of image features based on paraboloid surface fit

Shaun S. Gleason; Martin A. Hunt; W. Bruce Jatko

doi:10.1117/12.25386

Subpixel measurement of image features based on paraboloid surface fit

Shaun S. Gleason, Martin A. Hunt, W. Bruce Jatko

Office of Lab Dir - Science & Technology

Research output: Contribution to journal › Conference article › peer-review

27 Scopus citations

Abstract

A digital image processing inspection system is under development at Oak Ridge National Laboratory that will locate image features on printed material and measure distances between them to accuracies of 0.001 in. An algorithm has been developed for this system that can locate unique image features to subpixel accuracies. It is based on a least-squares fit of a paraboloid function to the surface generated by correlating a reference image feature against a test image search area. Normalizing the correlation surface makes the algorithm robust in the presence of illumination variations and local flaws. Subpixel accuracies of better than 1/16 of a pixel have been achieved using a variety of different reference image features.

Original language	English
Pages (from-to)	135-144
Number of pages	10
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1386
DOIs	https://doi.org/10.1117/12.25386
State	Published - Mar 1 1991
Event	Machine Vision Systems Integration in Industry 1990 - Boston, United States Duration: Nov 4 1990 → Nov 9 1990

Funding

Operated by Martin Marietta Energy Systems, Inc. for the U.S. Dept. of Energy under contract No. DE-ACO5-84OR21400 *operat1 by Martin Marietta Energy Systems, Inc. for the U.S. Dept. of Energy under contract No. DE-ACOS-840R21400

Funders	Funder number
Martin Marietta Energy Systems, Inc.
U.S. Dept. of Energy	DE-ACO5-84OR21400

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10.1117/12.25386

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abstract = "A digital image processing inspection system is under development at Oak Ridge National Laboratory that will locate image features on printed material and measure distances between them to accuracies of 0.001 in. An algorithm has been developed for this system that can locate unique image features to subpixel accuracies. It is based on a least-squares fit of a paraboloid function to the surface generated by correlating a reference image feature against a test image search area. Normalizing the correlation surface makes the algorithm robust in the presence of illumination variations and local flaws. Subpixel accuracies of better than 1/16 of a pixel have been achieved using a variety of different reference image features.",

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AU - Gleason, Shaun S.

AU - Hunt, Martin A.

AU - Bruce Jatko, W.

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N2 - A digital image processing inspection system is under development at Oak Ridge National Laboratory that will locate image features on printed material and measure distances between them to accuracies of 0.001 in. An algorithm has been developed for this system that can locate unique image features to subpixel accuracies. It is based on a least-squares fit of a paraboloid function to the surface generated by correlating a reference image feature against a test image search area. Normalizing the correlation surface makes the algorithm robust in the presence of illumination variations and local flaws. Subpixel accuracies of better than 1/16 of a pixel have been achieved using a variety of different reference image features.

AB - A digital image processing inspection system is under development at Oak Ridge National Laboratory that will locate image features on printed material and measure distances between them to accuracies of 0.001 in. An algorithm has been developed for this system that can locate unique image features to subpixel accuracies. It is based on a least-squares fit of a paraboloid function to the surface generated by correlating a reference image feature against a test image search area. Normalizing the correlation surface makes the algorithm robust in the presence of illumination variations and local flaws. Subpixel accuracies of better than 1/16 of a pixel have been achieved using a variety of different reference image features.

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JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Machine Vision Systems Integration in Industry 1990

Y2 - 4 November 1990 through 9 November 1990

ER -

Subpixel measurement of image features based on paraboloid surface fit

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