Sub-nanosecond time-of-flight for segmented silicon detectors

R. T. Desouza; A. Alexander; K. Brown; B. Floyd; Z. Q. Gosser; S. Hudan; J. Poehlman; M. J. Rudolph

doi:10.1016/j.nima.2010.12.101

Sub-nanosecond time-of-flight for segmented silicon detectors

R. T. Desouza
, A. Alexander
, K. Brown
, B. Floyd
, Z. Q. Gosser
, S. Hudan
, J. Poehlman
, M. J. Rudolph

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Development of a multichannel time-of-flight system for readout of a segmented, ion-passivated, ion-implanted silicon detector is described. This system provides sub-nanosecond resolution (δt≈370ps) even for low energy α particles which deposit E≤7.687MeV in the detector.

Original language	English
Pages (from-to)	133-136
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	632
Issue number	1
DOIs	https://doi.org/10.1016/j.nima.2010.12.101
State	Published - Mar 11 2011
Externally published	Yes

Funding

We gratefully acknowledge the support of the U.S. Department of Energy under Grant. No. DE-FG02-88ER-40404.

Keywords

Fast timing
Segmented silicon detectors
Silicon electronics
Time-of-flight

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10.1016/j.nima.2010.12.101

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abstract = "Development of a multichannel time-of-flight system for readout of a segmented, ion-passivated, ion-implanted silicon detector is described. This system provides sub-nanosecond resolution (δt≈370ps) even for low energy α particles which deposit E≤7.687MeV in the detector.",

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AU - Desouza, R. T.

AU - Alexander, A.

AU - Brown, K.

AU - Floyd, B.

AU - Gosser, Z. Q.

AU - Hudan, S.

AU - Poehlman, J.

AU - Rudolph, M. J.

PY - 2011/3/11

Y1 - 2011/3/11

N2 - Development of a multichannel time-of-flight system for readout of a segmented, ion-passivated, ion-implanted silicon detector is described. This system provides sub-nanosecond resolution (δt≈370ps) even for low energy α particles which deposit E≤7.687MeV in the detector.

AB - Development of a multichannel time-of-flight system for readout of a segmented, ion-passivated, ion-implanted silicon detector is described. This system provides sub-nanosecond resolution (δt≈370ps) even for low energy α particles which deposit E≤7.687MeV in the detector.

KW - Fast timing

KW - Segmented silicon detectors

KW - Silicon electronics

KW - Time-of-flight

UR - https://www.scopus.com/pages/publications/79551487003

U2 - 10.1016/j.nima.2010.12.101

DO - 10.1016/j.nima.2010.12.101

M3 - Article

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VL - 632

SP - 133

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JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

IS - 1

ER -

Sub-nanosecond time-of-flight for segmented silicon detectors

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Keywords

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