Abstract
Development of a multichannel time-of-flight system for readout of a segmented, ion-passivated, ion-implanted silicon detector is described. This system provides sub-nanosecond resolution (δt≈370ps) even for low energy α particles which deposit E≤7.687MeV in the detector.
Original language | English |
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Pages (from-to) | 133-136 |
Number of pages | 4 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 632 |
Issue number | 1 |
DOIs | |
State | Published - Mar 11 2011 |
Externally published | Yes |
Funding
We gratefully acknowledge the support of the U.S. Department of Energy under Grant. No. DE-FG02-88ER-40404.
Funders | Funder number |
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U.S. Department of Energy | DE-FG02-88ER-40404 |
Keywords
- Fast timing
- Segmented silicon detectors
- Silicon electronics
- Time-of-flight