Sub-ångstrom resolution through aberration-corrected STEM

  • S. J. Pennycook
  • , A. R. Lupini
  • , M. Varela
  • , A. Borisevich
  • , Y. Peng
  • , M. F. Chisholm
  • , N. Dellby
  • , O. L. Krivanek
  • , P. D. Nellist
  • , S. Z. Szilagyi
  • , G. Duscher

Research output: Contribution to journalArticlepeer-review

8 Scopus citations
Original languageEnglish
Pages (from-to)926-927
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
DOIs
StatePublished - 2003

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