Sub-ångstrom resolution through aberration-corrected STEM

S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, M. F. Chisholm, N. Dellby, O. L. Krivanek, P. D. Nellist, S. Z. Szilagyi, G. Duscher

Research output: Contribution to journalArticlepeer-review

7 Scopus citations
Original languageEnglish
Pages (from-to)926-927
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
DOIs
StatePublished - 2003

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