Original language | English |
---|---|
Pages (from-to) | 926-927 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 9 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - 2003 |
Sub-ångstrom resolution through aberration-corrected STEM
S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, M. F. Chisholm, N. Dellby, O. L. Krivanek, P. D. Nellist, S. Z. Szilagyi, G. Duscher
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations