Studying fatigue behavior and Poisson's ratio of bulk-metallic glasses

G. Y. Wang, P. K. Liaw, Y. Yokoyama, A. Peker, W. H. Peter, B. Yang, M. Freels, Z. Y. Zhang, V. Keppens, R. Hermann, R. A. Buchanan, C. T. Liu, C. R. Brooks

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

High-cycle fatigue (HCF) experiments were conducted on zirconium (Zr)-based bulk-metallic glasses (BMGs): Zr50Cu40Al10, Zr50Cu30Al10Ni10, Zr41.2Ti13.8Cu12.5Ni10Be22.5, and Zr50Cu37Al10Pd3 (in atomic percent) in air. The fatigue-endurance limit of Zr50Cu37Al10Pd3 was significantly greater than those of Zr50Cu40Al10, Zr50Cu30Al10Ni10, and Zr41.2Ti13.8Cu12.5Ni10Be22.5. The resonant ultrasound spectroscopy technique was employed to determine the Poisson's ratios, shear moduli, and bulk moduli of these BMGs. The ratio of the fatigue-endurance limit to the tensile strength increases with increasing Poisson's ratio. A possible relationship between the ratio of the fatigue-endurance limit to the tensile strength and the ratio of the shear modulus to the bulk modulus or Poisson's ratio will be discussed.

Original languageEnglish
Pages (from-to)663-667
Number of pages5
JournalIntermetallics
Volume15
Issue number5-6
DOIs
StatePublished - May 2007
Externally publishedYes

Funding

The present work is supported by the National Science Foundation (NSF), the Combined Research-Curriculum Development (CRCD) Program, under EEC-9527527 and EEC-0203415, the Integrative Graduate Education and Research Training (IGERT) Program, under DGE-9987548, and the International Materials Institutes (IMI) Program, under DMR-0231320, with Ms. M. Poats, and Drs. P.W. Jennings, L.S. Goldberg, L. Clesceri, and C. Huber as contract monitors.

FundersFunder number
Integrative Graduate Education and Research TrainingDGE-9987548
International Materials InstitutesDMR-0231320
National Science FoundationEEC-9527527, EEC-0203415

    Keywords

    • B. Fatigue resistance and crack growth
    • B. Glasses, metallic
    • C. Casting
    • F. Electron microscopy, scanning

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