Study of the atomic structures of Si3N4/CeO 2-δand Si3N4/SiO2 interfaces using STEM and first-principles methods

  • W. Walkosz
  • , R. F. Klie
  • , S. Öǧüt
  • , B. Mikijelj
  • , P. Becher
  • , A. Y. Borisevich
  • , S. J. Pennycook
  • , J. C. Idrobo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1014-1015
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

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