| Original language | English |
|---|---|
| Pages (from-to) | 1014-1015 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 15 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Jul 2009 |
Study of the atomic structures of Si3N4/CeO 2-δand Si3N4/SiO2 interfaces using STEM and first-principles methods
W. Walkosz, R. F. Klie, S. Öǧüt, B. Mikijelj, P. Becher, A. Y. Borisevich, S. J. Pennycook, J. C. Idrobo
Research output: Contribution to journal › Article › peer-review