Study of the atomic structures of Si3N4/CeO 2-δand Si3N4/SiO2 interfaces using STEM and first-principles methods

W. Walkosz, R. F. Klie, S. Öǧüt, B. Mikijelj, P. Becher, A. Y. Borisevich, S. J. Pennycook, J. C. Idrobo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1014-1015
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

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