Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM

Chen Li; Timothy J. Pennycook; Andrew R. Lupini; Donovan N. Leonard; Chad M. Parish; Manuel J. Romero; Helio Moutinho; Mowafak Al-Jassim; Yanfa Yan; Stephen J. Pennycook

doi:10.1017/S1431927612003972

Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM

Chen Li
, Timothy J. Pennycook
, Andrew R. Lupini
, Donovan N. Leonard
, Chad M. Parish
, Manuel J. Romero
, Helio Moutinho
, Mowafak Al-Jassim
, Yanfa Yan
, Stephen J. Pennycook

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	424-425
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612003972
State	Published - Jul 2012

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10.1017/S1431927612003972

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@article{5cc7fd6ba9824360be133b5521f6da95,

title = "Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM",

author = "Chen Li and Pennycook, \{Timothy J.\} and Lupini, \{Andrew R.\} and Leonard, \{Donovan N.\} and Parish, \{Chad M.\} and Romero, \{Manuel J.\} and Helio Moutinho and Mowafak Al-Jassim and Yanfa Yan and Pennycook, \{Stephen J.\}",

year = "2012",

month = jul,

doi = "10.1017/S1431927612003972",

language = "English",

volume = "18",

pages = "424--425",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S2",

}

TY - JOUR

T1 - Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM

AU - Li, Chen

AU - Pennycook, Timothy J.

AU - Lupini, Andrew R.

AU - Leonard, Donovan N.

AU - Parish, Chad M.

AU - Romero, Manuel J.

AU - Moutinho, Helio

AU - Al-Jassim, Mowafak

AU - Yan, Yanfa

AU - Pennycook, Stephen J.

PY - 2012/7

Y1 - 2012/7

UR - https://www.scopus.com/pages/publications/85008536271

U2 - 10.1017/S1431927612003972

DO - 10.1017/S1431927612003972

M3 - Article

AN - SCOPUS:85008536271

SN - 1431-9276

VL - 18

SP - 424

EP - 425

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM

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