Study of GaN radiation sensor after in-core neutron irradiation

Padhraic Mulligan, Jie Qiu, Jinghui Wang, Lei R. Cao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

GaN Schottky diode radiation detectors were fabricated on a 450-μm freestanding GaN wafer with a guard ring structure. The detectors were irradiated with neutron fluences up to 1016 n/cm2. The current-voltage relation, capacitance-voltage relation, charge collection efficiency, and alpha particle spectrum before and after irradiation were measured to characterize the radiation resistance of GaN devices. The detectors' performance showed insignificant changes after in-core neutron irradiation at 1015 n/cm2.

Original languageEnglish
Title of host publication2013 3rd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and Their Applications, ANIMMA 2013
DOIs
StatePublished - 2013
Externally publishedYes
Event2013 3rd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and Their Applications, ANIMMA 2013 - Marseille, France
Duration: Jun 23 2013Jun 27 2013

Publication series

Name2013 3rd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and Their Applications, ANIMMA 2013

Conference

Conference2013 3rd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and Their Applications, ANIMMA 2013
Country/TerritoryFrance
CityMarseille
Period06/23/1306/27/13

Keywords

  • Gallium nitride
  • alpha detector
  • high radiation field

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