Abstract
With a modified device structure which ensures the integrity of the barrier and facilitates base inversion, the concept of a GaAs inversion-base bipolar transistor (IBT) has been verified and its performance improved. The transistor action follows the theoretically expected temperature dependency of current which was not the case in previous work. The device threshold and offset voltages are too high for large-scale-integrated-circuit applications. Further device structure optimization and characterization are needed before the practical applications of the IBT can be realized.
Original language | English |
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Pages | 293-298 |
Number of pages | 6 |
State | Published - 1987 |
Externally published | Yes |