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Study of defect-dipoles in an epitaxial ferroelectric thin film
C. M. Folkman
, S. H. Baek
,
C. T. Nelson
, H. W. Jang
, T. Tybell
, X. Q. Pan
, C. B. Eom
Research output
:
Contribution to journal
›
Article
›
peer-review
68
Scopus citations
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Material Science
Bismuth Ferrite
100%
Ferroelectric Material
50%
Ferroelectric Thin Films
100%
Film
50%
Thin Films
50%
Physics
Ferroelectric Material
100%
Thin Films
100%