Structure of complex oxides in high electric fields

A. Grigoriev; R. Sichel; H. N. Lee; C. B. Eom; B. Adams; E. M. Dufresne; Z. Cai; P. G. Evans

doi:10.1017/S1431927608088533

Structure of complex oxides in high electric fields

A. Grigoriev
, R. Sichel
, H. N. Lee
, C. B. Eom
, B. Adams
, E. M. Dufresne
, Z. Cai
, P. G. Evans

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	222-223
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608088533
State	Published - Aug 2008

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title = "Structure of complex oxides in high electric fields",

author = "A. Grigoriev and R. Sichel and Lee, \{H. N.\} and Eom, \{C. B.\} and B. Adams and Dufresne, \{E. M.\} and Z. Cai and Evans, \{P. G.\}",

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language = "English",

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AU - Grigoriev, A.

AU - Sichel, R.

AU - Lee, H. N.

AU - Eom, C. B.

AU - Adams, B.

AU - Dufresne, E. M.

AU - Cai, Z.

AU - Evans, P. G.

PY - 2008/8

Y1 - 2008/8

UR - https://www.scopus.com/pages/publications/49549092682

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DO - 10.1017/S1431927608088533

M3 - Article

AN - SCOPUS:49549092682

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VL - 14

SP - 222

EP - 223

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Structure of complex oxides in high electric fields

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