Original language | English |
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Pages (from-to) | 222-223 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 14 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2008 |
Structure of complex oxides in high electric fields
A. Grigoriev, R. Sichel, H. N. Lee, C. B. Eom, B. Adams, E. M. Dufresne, Z. Cai, P. G. Evans
Research output: Contribution to journal › Article › peer-review