Structure and growth of strained Cu films on Ru(0001)

H. Zajonz, D. Gibbs, A. P. Baddorf, V. Jahns, D. M. Zehner

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19 Scopus citations

Abstract

We present X-ray scattering studies of the structure and growth of the heteroepitaxial interface Cu-Ru(0001) between 300 and 870 K. For Cu depositions of between one and two monolayers (ML), a bilayer stripe-phase coexists with domains pseudomorphic to the Ru substrate. At the completion of 2 ML, the stripe-phase wavevector abruptly locks to that of the substrate with a commensurability δ = 1/16 or 1/18, depending on the temperature. Above 2 ML, a cooperative growth process leads to three-phase coexistence, including the bilayer stripe-phase and rotated and unrotated bulk-like Cu islands.

Original languageEnglish
Pages (from-to)L141-L146
JournalSurface Science
Volume447
Issue number1
DOIs
StatePublished - Feb 20 2000

Funding

We acknowledge many helpful discussions with our colleagues Norm Bartelt, Jose De La Figuera-Bayon, John Hamilton, Bob Hwang, Karsten Pohl and Andreas Schmidt. Work performed at Brookhaven is supported by the US DOE, under contract DE-AC02-98CH10886. Lockheed Martin Energy Research Corp. manages Oak Ridge National Laboratory for the US DOE under contract DE-AC05-96OR22464.

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