Abstract
Transmission electron microscopy was used to examine the intrinsic factors influencing the size and distribution of a-domains in epitaxial PbTiO3 ferroelectric thin films grown by laser ablation. Films were deposited to thicknesses ranging from 87 nm to 350 nm onto SrTiO3 and MgO single crystal substrates, and onto MgO substrates covered by SrTiO3 or Pt interlayers. The structure of the 90° twin walls and of domain terminations was briefly discussed.
Original language | English |
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Pages | 564-565 |
Number of pages | 2 |
State | Published - 1994 |
Externally published | Yes |
Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Conference
Conference | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
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City | New Orleans, LA, USA |
Period | 07/31/94 → 08/5/94 |