Structural study on optical recording materials Ge2Sb2+xTe5 and GeBi2Te4

Shin ichi Shamoto, Noboru Yamada, Toshiyuki Matsunaga, Thomas Proffen

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Crystal structures of optical recording materials Ge2Sb2+xTe5 and GeBi2Te4 have been studied in terms of the fast phase transition mechanism by both real- and reciprocal-space Rietveld analyses of pulsed neutron powder diffraction data. These crystalline phases had large local lattice distortions. In addition, the crystallite size of GeBi2Te4 was very small (about 150 Å). These results suggest that the similarity of entropy between crystalline and amorphous phases plays an important role in terms of the fast phase transition mechanism.

Original languageEnglish
Pages (from-to)574-577
Number of pages4
JournalPhysica B: Physics of Condensed Matter
Volume385-386 I
DOIs
StatePublished - Nov 27 2006
Externally publishedYes

Funding

The authors thank Mr. K. Kawahara for sample preparation. This work was supported by a Grant-in-Aid for Scientific Research from the Ministry of Education, Culture, Sports, Science and Technology of Japan. Los Alamos National Laboratory is funded by DOE under Contract no. W-7405-ENG-36. The upgrade of NPDF has been funded by NSF through Grant no. DMR 00-76488.

Keywords

  • DVD
  • Fast phase transition mechanism
  • Neutron powder diffraction
  • Optical recording material
  • PDF analysis

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