Structural phase transitions in AgTa0.5Nb0.5O 3 thin films

Y. Han; I. M. Reaney; R. L. Johnson-Wilke; M. B. Telli; D. S. Tinberg; I. Levin; D. D. Fong; T. T. Fister; S. K. Streiffer; S. Trolier-Mckinstry

doi:10.1063/1.3447753

Structural phase transitions in AgTa_0.5Nb_0.5O ₃ thin films

Y. Han, I. M. Reaney, R. L. Johnson-Wilke, M. B. Telli, D. S. Tinberg, I. Levin, D. D. Fong, T. T. Fister, S. K. Streiffer, S. Trolier-Mckinstry

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Octahedral tilt transitions in epitaxial AgTa_0.5Nb _0.5O₃ (ATN) films grown on (001)_p (where p=pseudocubic) oriented SrRuO₃/LaAlO₃ and LaAlO ₃ substrates were characterized by electron diffraction and high resolution x-ray diffraction. It was found that the ATN films exhibited octahedral rotations characteristic of the Pbcm space group, similar to those seen in bulk materials; however, the temperature of the M₃↔ M₂ phase transition has been suppressed by ∼250 K due to the fact that the correlation length for rotations about c_p was significantly reduced. The average off-center B-cation displacements, which signify the degree of long-range order for these local cation positions, were negligibly small compared to bulk materials, as inferred from the near-zero intensity of the 1/4(00l)_p-type reflections. On cooling, pronounced ordering of B-cation displacements occurred at ≈60 K which is significantly lower compared to bulk (≈310 K). The onset of this ordering coincides with a broad maximum in relative permittivity as a function of temperature. It is believed that point and planar defects in thin ATN films disrupt the complex sequence of in-phase and antiphase rotations around c_p thereby reducing the effective strength of interactions between the tilting and cation displacements.

Original language	English
Article number	123517
Journal	Journal of Applied Physics
Volume	107
Issue number	12
DOIs	https://doi.org/10.1063/1.3447753
State	Published - Jun 15 2010
Externally published	Yes

Funding

Financial support for this work is provided by the Engineering and Physical Science Research Council U.K. (Grant No. EP/D067049/1G) and by the National Science Foundation (Materials World Network, Grant No. DMR-0602770). Y. Han would like to thank Professors Paula Vilarinho and Augusto Lopes at the University of Aveiro, Portugal, for providing the TEM facilities for performing the low temperature experiment. Work at Argonne and the use of the Advanced Photon Source and the Center for Nanoscale Materials were supported by the U.S. Department of Energy, Office of Science, and Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. Jenia Karapetrova’s help at beamline 33-BM of the Advanced Photon Source, along with Pete Baldo’s technical assistance is gratefully acknowledged.

Funders	Funder number
Materials World Network	DMR-0602770
National Science Foundation
U.S. Department of Energy
Office of Science
Basic Energy Sciences	DE-AC02-06CH11357
Engineering and Physical Sciences Research Council	EP/F012403/1, EP/D067049/1

Access to Document

10.1063/1.3447753

Cite this

@article{c2cdf5a1aa544de5a07067a8b25e7250,

title = "Structural phase transitions in AgTa0.5Nb0.5O 3 thin films",

abstract = "Octahedral tilt transitions in epitaxial AgTa0.5Nb 0.5O3 (ATN) films grown on (001)p (where p=pseudocubic) oriented SrRuO3/LaAlO3 and LaAlO 3 substrates were characterized by electron diffraction and high resolution x-ray diffraction. It was found that the ATN films exhibited octahedral rotations characteristic of the Pbcm space group, similar to those seen in bulk materials; however, the temperature of the M3↔ M2 phase transition has been suppressed by ∼250 K due to the fact that the correlation length for rotations about cp was significantly reduced. The average off-center B-cation displacements, which signify the degree of long-range order for these local cation positions, were negligibly small compared to bulk materials, as inferred from the near-zero intensity of the 1/4(00l)p-type reflections. On cooling, pronounced ordering of B-cation displacements occurred at ≈60 K which is significantly lower compared to bulk (≈310 K). The onset of this ordering coincides with a broad maximum in relative permittivity as a function of temperature. It is believed that point and planar defects in thin ATN films disrupt the complex sequence of in-phase and antiphase rotations around cp thereby reducing the effective strength of interactions between the tilting and cation displacements.",

author = "Y. Han and Reaney, {I. M.} and Johnson-Wilke, {R. L.} and Telli, {M. B.} and Tinberg, {D. S.} and I. Levin and Fong, {D. D.} and Fister, {T. T.} and Streiffer, {S. K.} and S. Trolier-Mckinstry",

year = "2010",

month = jun,

day = "15",

doi = "10.1063/1.3447753",

language = "English",

volume = "107",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "12",

}

TY - JOUR

T1 - Structural phase transitions in AgTa0.5Nb0.5O 3 thin films

AU - Han, Y.

AU - Reaney, I. M.

AU - Johnson-Wilke, R. L.

AU - Telli, M. B.

AU - Tinberg, D. S.

AU - Levin, I.

AU - Fong, D. D.

AU - Fister, T. T.

AU - Streiffer, S. K.

AU - Trolier-Mckinstry, S.

PY - 2010/6/15

Y1 - 2010/6/15

N2 - Octahedral tilt transitions in epitaxial AgTa0.5Nb 0.5O3 (ATN) films grown on (001)p (where p=pseudocubic) oriented SrRuO3/LaAlO3 and LaAlO 3 substrates were characterized by electron diffraction and high resolution x-ray diffraction. It was found that the ATN films exhibited octahedral rotations characteristic of the Pbcm space group, similar to those seen in bulk materials; however, the temperature of the M3↔ M2 phase transition has been suppressed by ∼250 K due to the fact that the correlation length for rotations about cp was significantly reduced. The average off-center B-cation displacements, which signify the degree of long-range order for these local cation positions, were negligibly small compared to bulk materials, as inferred from the near-zero intensity of the 1/4(00l)p-type reflections. On cooling, pronounced ordering of B-cation displacements occurred at ≈60 K which is significantly lower compared to bulk (≈310 K). The onset of this ordering coincides with a broad maximum in relative permittivity as a function of temperature. It is believed that point and planar defects in thin ATN films disrupt the complex sequence of in-phase and antiphase rotations around cp thereby reducing the effective strength of interactions between the tilting and cation displacements.

AB - Octahedral tilt transitions in epitaxial AgTa0.5Nb 0.5O3 (ATN) films grown on (001)p (where p=pseudocubic) oriented SrRuO3/LaAlO3 and LaAlO 3 substrates were characterized by electron diffraction and high resolution x-ray diffraction. It was found that the ATN films exhibited octahedral rotations characteristic of the Pbcm space group, similar to those seen in bulk materials; however, the temperature of the M3↔ M2 phase transition has been suppressed by ∼250 K due to the fact that the correlation length for rotations about cp was significantly reduced. The average off-center B-cation displacements, which signify the degree of long-range order for these local cation positions, were negligibly small compared to bulk materials, as inferred from the near-zero intensity of the 1/4(00l)p-type reflections. On cooling, pronounced ordering of B-cation displacements occurred at ≈60 K which is significantly lower compared to bulk (≈310 K). The onset of this ordering coincides with a broad maximum in relative permittivity as a function of temperature. It is believed that point and planar defects in thin ATN films disrupt the complex sequence of in-phase and antiphase rotations around cp thereby reducing the effective strength of interactions between the tilting and cation displacements.

UR - http://www.scopus.com/inward/record.url?scp=77954182977&partnerID=8YFLogxK

U2 - 10.1063/1.3447753

DO - 10.1063/1.3447753

M3 - Article

AN - SCOPUS:77954182977

SN - 0021-8979

VL - 107

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 12

M1 - 123517

ER -

Structural phase transitions in AgTa_0.5Nb_0.5O ₃ thin films

Abstract

Funding

Access to Document

Other files and links

Fingerprint

Cite this