Structural difference of two classes of amorphous semiconductors

V. K. Malinovsky; V. N. Novikov; A. P. Sokolov

doi:10.1016/0022-3093(89)90068-9

Structural difference of two classes of amorphous semiconductors

V. K. Malinovsky
, V. N. Novikov
, A. P. Sokolov

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

It is found that the form of the low-frequency boson peak in the Raman spectra is quite different in the samples of two different classes of amorphous semiconductors. The spectra analysis has substantiated a conclusion on distinct structural features of the two classes of amorphous solids thus furnishing an explanation of their different properties.

Original language	English
Pages (from-to)	61-63
Number of pages	3
Journal	Journal of Non-Crystalline Solids
Volume	114
Issue number	PART 1
DOIs	https://doi.org/10.1016/0022-3093(89)90068-9
State	Published - Dec 1 1989
Externally published	Yes

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10.1016/0022-3093(89)90068-9

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@article{b4740b6d692a467d8c12a7c04b509506,

title = "Structural difference of two classes of amorphous semiconductors",

abstract = "It is found that the form of the low-frequency boson peak in the Raman spectra is quite different in the samples of two different classes of amorphous semiconductors. The spectra analysis has substantiated a conclusion on distinct structural features of the two classes of amorphous solids thus furnishing an explanation of their different properties.",

author = "Malinovsky, \{V. K.\} and Novikov, \{V. N.\} and Sokolov, \{A. P.\}",

year = "1989",

month = dec,

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doi = "10.1016/0022-3093(89)90068-9",

language = "English",

volume = "114",

pages = "61--63",

journal = "Journal of Non-Crystalline Solids",

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T1 - Structural difference of two classes of amorphous semiconductors

AU - Malinovsky, V. K.

AU - Novikov, V. N.

AU - Sokolov, A. P.

PY - 1989/12/1

Y1 - 1989/12/1

N2 - It is found that the form of the low-frequency boson peak in the Raman spectra is quite different in the samples of two different classes of amorphous semiconductors. The spectra analysis has substantiated a conclusion on distinct structural features of the two classes of amorphous solids thus furnishing an explanation of their different properties.

AB - It is found that the form of the low-frequency boson peak in the Raman spectra is quite different in the samples of two different classes of amorphous semiconductors. The spectra analysis has substantiated a conclusion on distinct structural features of the two classes of amorphous solids thus furnishing an explanation of their different properties.

UR - https://www.scopus.com/pages/publications/0024847080

U2 - 10.1016/0022-3093(89)90068-9

DO - 10.1016/0022-3093(89)90068-9

M3 - Article

AN - SCOPUS:0024847080

SN - 0022-3093

VL - 114

SP - 61

EP - 63

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

IS - PART 1

ER -

Structural difference of two classes of amorphous semiconductors

Abstract

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