Structural characterization of pressure-induced amorphous silicon

Engineering

• Low-Temperature 100%
• Range Order 100%
• Amorphous Phase 50%
• Crystalline Phase 50%
• Plastic Flow 50%
• Final State 50%
• Thermal History 50%
• Indentation 50%
• Common State 50%
• Diffracted Intensity 50%
• Ion Implantation 50%
• Initial State 50%
• Network Model 50%

Material Science

• Amorphous Silicon 100%
• Annealing 12%
• Ion Implantation 12%
• Mechanical Testing 12%
• Indentation 12%
• Electron Microscopy 12%
• Short-Range Order 12%
• Plastic Flow 12%
• Medium-Range Order 12%