Structural characterization of a coarsegrained transparent silicon carbide powder by a combination of powder diffraction techniques

B. Peplinski; A. N. Fitch; A. Evans; R. M. Ibberson; D. M. Többens; L. M.D. Cranswick; I. Dörfel; F. Emmerling; R. Matschat

doi:10.1524/zksu.2009.0009

Structural characterization of a coarsegrained transparent silicon carbide powder by a combination of powder diffraction techniques

B. Peplinski, A. N. Fitch, A. Evans, R. M. Ibberson, D. M. Többens, L. M.D. Cranswick, I. Dörfel, F. Emmerling, R. Matschat

Research output: Contribution to journal › Article › peer-review

Abstract

Diffraction of hard synchrotron radiation as well as constant-wavelength and time-of-flight neutron diffraction were used for the structural characterization of a silicon carbide powder having extremely low levels of chemical impurities, high perfection of the crystalline lattice and a grain size of up to 150 μm. The presence of three polytypes was ascertained and the ratios of their mass fractions were determined to be w _15R: w _6H = 0.002,3(8) and w _4H: w _6H = 0.000,6(2).

Original language	English
Pages (from-to)	61-66
Number of pages	6
Journal	Zeitschrift fur Kristallographie, Supplement
Issue number	30
DOIs	https://doi.org/10.1524/zksu.2009.0009
State	Published - 2009
Externally published	Yes

Keywords

Phase quantification
Polytypes
Reference material
Silicon carbide

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10.1524/zksu.2009.0009

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Peplinski, B., Fitch, A. N., Evans, A., Ibberson, R. M., Többens, D. M., Cranswick, L. M. D., Dörfel, I., Emmerling, F., & Matschat, R. (2009). Structural characterization of a coarsegrained transparent silicon carbide powder by a combination of powder diffraction techniques. Zeitschrift fur Kristallographie, Supplement, (30), 61-66. https://doi.org/10.1524/zksu.2009.0009

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abstract = "Diffraction of hard synchrotron radiation as well as constant-wavelength and time-of-flight neutron diffraction were used for the structural characterization of a silicon carbide powder having extremely low levels of chemical impurities, high perfection of the crystalline lattice and a grain size of up to 150 μm. The presence of three polytypes was ascertained and the ratios of their mass fractions were determined to be w 15R: w 6H = 0.002,3(8) and w 4H: w 6H = 0.000,6(2).",

keywords = "Phase quantification, Polytypes, Reference material, Silicon carbide",

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doi = "10.1524/zksu.2009.0009",

language = "English",

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AU - Peplinski, B.

AU - Fitch, A. N.

AU - Evans, A.

AU - Ibberson, R. M.

AU - Többens, D. M.

AU - Cranswick, L. M.D.

AU - Dörfel, I.

AU - Emmerling, F.

AU - Matschat, R.

PY - 2009

Y1 - 2009

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AB - Diffraction of hard synchrotron radiation as well as constant-wavelength and time-of-flight neutron diffraction were used for the structural characterization of a silicon carbide powder having extremely low levels of chemical impurities, high perfection of the crystalline lattice and a grain size of up to 150 μm. The presence of three polytypes was ascertained and the ratios of their mass fractions were determined to be w 15R: w 6H = 0.002,3(8) and w 4H: w 6H = 0.000,6(2).

KW - Phase quantification

KW - Polytypes

KW - Reference material

KW - Silicon carbide

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ER -

Structural characterization of a coarsegrained transparent silicon carbide powder by a combination of powder diffraction techniques

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Keywords

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