Abstract
Multiferroic BFO/PZT multilayer films were fabricated by spin-coating method on the (1 1 1)Pt/Ti/SiO 2/Si substrate alternately using PZT(30/70), PZT(70/30) and BFO alkoxide solutions. The structural and ferroelectric properties were investigated for uncooled infrared detector applications. The coating and heating procedure was repeated six times to form BFO/PZT multilayer films. All films showed the typical XRD patterns of the perovskite polycrystalline structure without presence of the second phase such as Bi 2Fe 4O 3. The thickness of BFO/PZT multilayer film was about 200-220 nm. The ferroelectric properties such as dielectric constant, remnant polarization and pyroelectric coefficient were superior to those of single composition BFO film, and those values for BFO/PZT(70/30) multilayer film were 288, 15.7 μC/cm 2 and 9.1 × 10 -9 C/cm 2 K at room temperature, respectively. Leakage current density of the BFO/PZT(30/70) multilayer film was 3.3 × 10 -9 A/cm 2 at 150 kV/cm. The figures of merit, F V for the voltage responsivity and F D for the specific detectivity, of the BFO/PZT(70/30) multilayer film were 6.17 × 10 -11 Ccm/J and 6.45 × 10 -9 Ccm/J, respectively.
| Original language | English |
|---|---|
| Pages (from-to) | 409-412 |
| Number of pages | 4 |
| Journal | Materials Research Bulletin |
| Volume | 47 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2012 |
| Externally published | Yes |
Funding
This work was supported by the Korea Research Foundation (KRF) grant funded by the Korea government (MEST) (No. 2009-0077690 ).
Keywords
- A. Ceramics
- A. Multilayer
- A. Thin films
- D. Ferroelectricity