Structural and optical characterization of fluorinated hydrogenated silicon carbide films deposited by pulsed glow discharge

L. G. Jacobsohn, D. F. Franceschini, I. V. Afanasyev-Charkin, D. W. Cooke, L. L. Daemen, R. D. Averitt, M. Nastasi

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The effects on fluorine incorporation on the structure and optical properties of amorphous hydrogenated silicon carbide films deposited by pulsed glow discharge were investigated. Fluorine is incorporated at the expense of silicon, and films with up to 16 at.% of fluorine were obtained as determined by ion beam analysis. Structural investigation was carried by Raman and infrared spectroscopies. Infrared results showed that incorporation of fluorine occurs in the form of Si-F bonds, and Raman results showed a progressive formation of graphitic agglomerates due to fluorine incorporation in the films. Because of the relatively high bonding energy of Si-F, preferential bonding of fluorine with silicon induces small changes in the optical gap.

Original languageEnglish
Pages (from-to)6079-6082
Number of pages4
JournalSurface and Coatings Technology
Volume200
Issue number20-21
DOIs
StatePublished - May 22 2006
Externally publishedYes

Funding

The authors are thankful to the Ion Beam Materials Laboratory staff for their support during the IBA measurements and to B. L. Bennett for the optical measurements. This work was supported by the DOE, Office of Basic Energy Sciences.

FundersFunder number
U.S. Department of Energy
Basic Energy Sciences

    Keywords

    • Fluorine
    • Glow discharge
    • Optical properties
    • Silicon carbide

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