TY - JOUR
T1 - Structural and electrical anisotropy of (001)-, (116)-, and (103)-oriented epitaxial SrBi2Ta2O9 thin films on SrTiO3 substrates grown by pulsed laser deposition
AU - Lee, Ho Nyung
AU - Visinoiu, Alina
AU - Senz, Stephan
AU - Harnagea, Catalin
AU - Pignolet, Alain
AU - Hesse, Dietrich
AU - Gösele, Ulrich
PY - 2000/12
Y1 - 2000/12
N2 - Epitaxial SrBi2Ta2O9 (SBT) thin films with well-defined (001), (116), and (103) orientations have been grown by pulsed laser deposition on (001)-, (011)-, and (111)-oriented Nb-doped SrTiO3 substrates. X-ray diffraction pole figure and φ-scan measurements revealed that the three-dimensional epitaxial orientation relation SBT(001)∥SrTiO3(001), and SBT[110]∥SrTiO3[100] is valid for all cases of SBT thin films on SrTiO3 substrates, irrespective of their orientations. Atomic force microscopy images of the c-axis-oriented SBT revealed polyhedron-shaped grains showing spiral growth around screw dislocations. The terrace steps of the c-axis-oriented SBT films were integral multiples of a quarter of the lattice parameter c of SBT (∼0.6 nm). The grains of (103)-oriented SBT films were arranged in a triple-domain configuration consistent with the symmetry of the SrTiO3(111) substrate. The measured remanent polarization (2Pr) and coercive field (2Ec) of (116)-oriented SBT films were 9.6 μC/cm2 and 168 kV/cm, respectively, for a maximum applied electric field of 320 kV/cm. Higher remanent polarization (2Pr=10.4 μC/cm2) and lower coercive field (2Ec=104 kV/cm) than those of SBT(116) films were observed in (103)-oriented SBT thin films, and (001)-oriented SBT revealed no ferroelectricity along the [001] axis. The dielectric constants of (001)-, (116)-, and (103)-oriented SBT were 133, 155, and 189, respectively.
AB - Epitaxial SrBi2Ta2O9 (SBT) thin films with well-defined (001), (116), and (103) orientations have been grown by pulsed laser deposition on (001)-, (011)-, and (111)-oriented Nb-doped SrTiO3 substrates. X-ray diffraction pole figure and φ-scan measurements revealed that the three-dimensional epitaxial orientation relation SBT(001)∥SrTiO3(001), and SBT[110]∥SrTiO3[100] is valid for all cases of SBT thin films on SrTiO3 substrates, irrespective of their orientations. Atomic force microscopy images of the c-axis-oriented SBT revealed polyhedron-shaped grains showing spiral growth around screw dislocations. The terrace steps of the c-axis-oriented SBT films were integral multiples of a quarter of the lattice parameter c of SBT (∼0.6 nm). The grains of (103)-oriented SBT films were arranged in a triple-domain configuration consistent with the symmetry of the SrTiO3(111) substrate. The measured remanent polarization (2Pr) and coercive field (2Ec) of (116)-oriented SBT films were 9.6 μC/cm2 and 168 kV/cm, respectively, for a maximum applied electric field of 320 kV/cm. Higher remanent polarization (2Pr=10.4 μC/cm2) and lower coercive field (2Ec=104 kV/cm) than those of SBT(116) films were observed in (103)-oriented SBT thin films, and (001)-oriented SBT revealed no ferroelectricity along the [001] axis. The dielectric constants of (001)-, (116)-, and (103)-oriented SBT were 133, 155, and 189, respectively.
UR - http://www.scopus.com/inward/record.url?scp=0000574168&partnerID=8YFLogxK
U2 - 10.1063/1.1321776
DO - 10.1063/1.1321776
M3 - Article
AN - SCOPUS:0000574168
SN - 0021-8979
VL - 88
SP - 6658
EP - 6664
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 11
ER -