Stray light characterization in a high-resolution imaging spectrometer designed for solar-induced fluorescence

New commercial-off-the-shelf imaging spectrometers promise the combination of high spatial and spectral resolution needed to retrieve solar induced fluorescence (SIF). Imaging at multiple wavelengths for individual plants and even individual leaves from low-altitude airborne or ground-based platforms has applications in agriculture and carbon-cycle science. Data from these instruments could provide insight into the status of the photosynthetic apparatus at scales of space and time not observable with tools based on gas exchange, and could support the calibration and validation activities of current and forthcoming space missions to quantify SIF. High-spectral resolution enables SIF retrieval from regions of strong telluric absorption by molecular oxygen, and also within numerous solar Fraunhofer lines in atmospheric windows not obscured by oxygen or water absorptions. Because the SIF signal can be < 5 % of background reflectance, rigorous instrument characterization and reduction of systematic error is necessary. Here we develop a spectral stray-light correction algorithm for a commercial off-the-shelf imaging spectrometer designed to quantify SIF. We use measurements from an optical parametric oscillator laser at 44 wavelengths to generate the spectral line-spread function and develop a spectral stray-light correction matrix using a novel exposure-bracketing method. The magnitude of spectral stray light in this instrument is small, but spectral stray light is detectable at all measured wavelengths. Examination of corrected line-spread functions indicates that the correction algorithm reduced spectral stray-light by 1 to 2 orders of magnitude.