Strain tuning of ferroelectric thin films

Darrell G. Schlom, Long Qing Chen, Chang Beom Eom, Karin M. Rabe, Stephen K. Streiffer, Jean Marc Triscone

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

1002 Scopus citations

Abstract

Predictions and measurements of the effect of biaxial strain on the properties of epitaxial ferroelectric thin films and superlattices are reviewed. Results for single-layer ferroelectric films of biaxially strained SrTiO 3, BaTiO3, and PbTiO3 as well as PbTi03/SrTi03 and BaTiO3/SrTiO3 superlattices are described. Theoretical approaches, including first principles, thermodynamic analysis, and phase-field models, are applied to these biaxially strained materials, the assumptions and limitations of each technique are explained, and the predictions are compared. Measurements of the effect of biaxial strain on the paraelectric-to- ferroelectric transition temperature (TC) are shown, demonstrating the ability of percent-level strains to shift TC by hundreds of degrees in agreement with the predictions that predated such experiments. Along the way, important experimental techniques for characterizing the properties of strained ferroelectric thin films and superlattices, as well as appropriate substrates on which to grow them, are mentioned.

Original languageEnglish
Title of host publicationAnnual Review of Materials Research
EditorsDavid Clarke, Manfred Ruehle, Venkatraman Gopalan
Pages589-626
Number of pages38
DOIs
StatePublished - 2007
Externally publishedYes

Publication series

NameAnnual Review of Materials Research
Volume37
ISSN (Print)1531-7331

Keywords

  • Epitaxial oxide films
  • Ferroelectric characterization methods
  • Multicomponent oxides
  • Substrates
  • Superlattices
  • Theory and simulation

Fingerprint

Dive into the research topics of 'Strain tuning of ferroelectric thin films'. Together they form a unique fingerprint.

Cite this