Strain-relaxation and critical thickness of epitaxial La1.85Sr0.15CuO4 films

T. L. Meyer; L. Jiang; S. Park; T. Egami; H. N. Lee

doi:10.1063/1.4937170

Strain-relaxation and critical thickness of epitaxial La_1.85Sr_0.15CuO₄ films

T. L. Meyer, L. Jiang, S. Park, T. Egami, H. N. Lee

Materials Science and Technology Div

Research output: Contribution to journal › Article › peer-review

37 Scopus citations

Abstract

We report the thickness-dependent strain-relaxation behavior and the associated impacts upon the superconductivity in epitaxial La_1.85Sr_0.15CuO₄ films grown on different substrates, which provide a range of strain. We have found that the critical thickness for the onset of superconductivity in La_1.85Sr_0.15CuO₄ films is associated with the finite thickness effect and epitaxial strain. In particular, thin films with tensile strain greater than ∼0.25% revealed no superconductivity. We attribute this phenomenon to the inherent formation of oxygen vacancies that can be minimized via strain relaxation.

Original language	English
Article number	126102
Journal	APL Materials
Volume	3
Issue number	12
DOIs	https://doi.org/10.1063/1.4937170
State	Published - Dec 1 2015

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title = "Strain-relaxation and critical thickness of epitaxial La1.85Sr0.15CuO4 films",

abstract = "We report the thickness-dependent strain-relaxation behavior and the associated impacts upon the superconductivity in epitaxial La1.85Sr0.15CuO4 films grown on different substrates, which provide a range of strain. We have found that the critical thickness for the onset of superconductivity in La1.85Sr0.15CuO4 films is associated with the finite thickness effect and epitaxial strain. In particular, thin films with tensile strain greater than ∼0.25% revealed no superconductivity. We attribute this phenomenon to the inherent formation of oxygen vacancies that can be minimized via strain relaxation.",

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AU - Meyer, T. L.

AU - Jiang, L.

AU - Park, S.

AU - Egami, T.

AU - Lee, H. N.

PY - 2015/12/1

Y1 - 2015/12/1

N2 - We report the thickness-dependent strain-relaxation behavior and the associated impacts upon the superconductivity in epitaxial La1.85Sr0.15CuO4 films grown on different substrates, which provide a range of strain. We have found that the critical thickness for the onset of superconductivity in La1.85Sr0.15CuO4 films is associated with the finite thickness effect and epitaxial strain. In particular, thin films with tensile strain greater than ∼0.25% revealed no superconductivity. We attribute this phenomenon to the inherent formation of oxygen vacancies that can be minimized via strain relaxation.

AB - We report the thickness-dependent strain-relaxation behavior and the associated impacts upon the superconductivity in epitaxial La1.85Sr0.15CuO4 films grown on different substrates, which provide a range of strain. We have found that the critical thickness for the onset of superconductivity in La1.85Sr0.15CuO4 films is associated with the finite thickness effect and epitaxial strain. In particular, thin films with tensile strain greater than ∼0.25% revealed no superconductivity. We attribute this phenomenon to the inherent formation of oxygen vacancies that can be minimized via strain relaxation.

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JO - APL Materials

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Strain-relaxation and critical thickness of epitaxial La_1.85Sr_0.15CuO₄ films

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