Strain hardening and long-range internal stress in the localized deformation of irradiated polycrystalline metals

Thak Sang Byun, Naoyuki Hashimoto

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

Low-temperature irradiation can significantly harden metallic materials and often results in microscopic strain localization such as dislocation channeling during deformation. In true stress-true strain analyses, however, the strain localization does not significantly affect macroscopic strain-hardening behavior. It was attempted to explain the strain-hardening behavior during strain localization in terms of long-range back stresses. In theoretical modeling the long-range back stress was formulated as a function of the number of residual pileup dislocations at a grain boundary and the number of localized bands formed in a grain. The strain-hardening rates in channel deformation were calculated for ten face-centered cubic (fcc) and body-centered cubic (bcc) metals. A few residual dislocations in each channel could account for the strain-hardening rates as high as those for uniform deformation. It was also shown that the strain-hardening behavior predicted by the long-range back stress model resembled the empirical strain-hardening behaviors, which result from both localized and non-localized deformations. The predicted plastic instability stress was comparable to the tensile test data.

Original languageEnglish
Pages (from-to)123-130
Number of pages8
JournalJournal of Nuclear Materials
Volume354
Issue number1-3
DOIs
StatePublished - Aug 1 2006

Funding

This research was sponsored by US Department of Energy, Office of Fusion Energy Sciences, under Contract DE-AC05-00OR22725 with UT-Battelle, LLC. The authors would like to express special thanks to Drs S.J. Zinkle, J.T. Busby, and Y.N. Osestkiy for their technical reviews and thoughtful comments.

FundersFunder number
US Department of Energy
Fusion Energy SciencesDE-AC05-00OR22725

    Keywords

    • C1200
    • D0400
    • M0300
    • R0300
    • T0100

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