Abstract
We report the structural and magnetic characterization of sputter deposited epitaxial Ho. We present room temperature characterization by atomic force microscopy and x-ray diffraction and temperature dependent characterization by x-ray diffraction and neutron diffraction. The data show the onset and change of the magnetic state as a function of temperature. Films of different thickness, exhibiting signs of differing epitaxially induced strain, tend towards specific spin-slip phases in the low temperature regime. The more highly strained thinnest films tend towards values with a longer magnetic wavelength.
| Original language | English |
|---|---|
| Article number | 416006 |
| Journal | Journal of Physics Condensed Matter |
| Volume | 23 |
| Issue number | 41 |
| DOIs | |
| State | Published - Oct 19 2011 |
| Externally published | Yes |