Abstract
We report the structural and magnetic characterization of sputter deposited epitaxial Ho. We present room temperature characterization by atomic force microscopy and x-ray diffraction and temperature dependent characterization by x-ray diffraction and neutron diffraction. The data show the onset and change of the magnetic state as a function of temperature. Films of different thickness, exhibiting signs of differing epitaxially induced strain, tend towards specific spin-slip phases in the low temperature regime. The more highly strained thinnest films tend towards values with a longer magnetic wavelength.
Original language | English |
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Article number | 416006 |
Journal | Journal of Physics Condensed Matter |
Volume | 23 |
Issue number | 41 |
DOIs | |
State | Published - Oct 19 2011 |
Externally published | Yes |