Stacking Fault Induced Symmetry Breaking in van der Waals Nanowires

Eli Sutter, Hannu Pekka Komsa, Alexander A. Puretzky, Raymond R. Unocic, Peter Sutter

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

While traditional ferroelectrics are based on polar crystals in bulk or thin film form, two-dimensional and layered materials can support mechanisms for symmetry breaking between centrosymmetric building blocks, e.g., by creating low-symmetry interfaces in van der Waals stacks. Here, we introduce an approach toward symmetry breaking in van der Waals crystals that relies on the spontaneous incorporation of stacking faults in a nonpolar bulk layer sequence. The concept is realized in nanowires consisting of Se-rich group IV monochalcogenide (GeSe1-xSx) alloys, obtained by vapor-liquid-solid growth. The single crystalline wires adopt a layered structure in which the nonpolar A-B bulk stacking along the nanowire axis is interrupted by single-layer stacking faults with local A-A′ stacking. Density functional theory explains this behavior by a reduced stacking fault formation energy in GeSe (or Se-rich GeSe1-xSxalloys). Computations demonstrate that, similar to monochalcogenide monolayers, the inserted A-layers should show a spontaneous electric polarization with a switching barrier consistent with a Curie temperature above room temperature. Second-harmonic generation signals are consistent with a variable density of stacking faults along the wires. Our results point to possible routes for designing ferroelectrics via the layer stacking in van der Waals crystals.

Original languageEnglish
Pages (from-to)21199-21207
Number of pages9
JournalACS Nano
Volume16
Issue number12
DOIs
StatePublished - Dec 27 2022

Funding

This work was supported by the National Science Foundation, Division of Materials Research, Solid State and Materials Chemistry Program under Grant No. DMR-1904843. EDS measurements were performed in the Nebraska Nanoscale Facility: National Nanotechnology Coordinated Infrastructure and the Nebraska Center for Materials and Nanoscience, which are supported by the National Science Foundation under Award ECCS: 2025298, and the Nebraska Research Initiative. SHG measurements and aberration-corrected STEM imaging were supported by the Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. The authors acknowledge CSC – IT Center for Science, Finland, for computational resources.

FundersFunder number
Center for Nanophase Materials Sciences
National Science Foundation
U.S. Department of Energy
Division of Materials Research2025298, DMR-1904843
Office of Science
Oak Ridge National Laboratory

    Keywords

    • Layered crystals
    • alloy
    • electron microscopy
    • germanium selenide
    • germanium sulfide
    • planar defects
    • van der Waals stacking

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