Sr/Bi ratio effects for SrxBiyTa2O9 grown by pulsed laser ablation

Darin T. Thomas, Norifumi Fujimura, S. K. Streiffer, Orlando Auciello, Angus I. Kingon

Research output: Contribution to conferencePaperpeer-review

4 Scopus citations

Abstract

In this study we report the effect of variations in the Sr/Bi ratio on the properties of thin film strontium bismuth tantalate (SBT), one of the primary candidates for ferroelectric nonvolatile memories. The composition was varied according to the formulation Sr1-zBi2.1+2/3zTa2O9. Films were prepared by pulsed laser ablation from ceramic targets. The largest switched polarizations were measured for compositions with z = 0. Results are compared to other studies where off-stoichiometric compositions yielded the largest polarizations. In attempting to reduce the processing temperatures, moderate ferroelectric properties were achieved at 650 °C.

Original languageEnglish
Pages495-498
Number of pages4
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) - East Brunswick, NJ, USA
Duration: Aug 18 1996Aug 21 1996

Conference

ConferenceProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2)
CityEast Brunswick, NJ, USA
Period08/18/9608/21/96

Fingerprint

Dive into the research topics of 'Sr/Bi ratio effects for SrxBiyTa2O9 grown by pulsed laser ablation'. Together they form a unique fingerprint.

Cite this