Abstract
Recently optical microscopic surface imaging resolution has been extended beyond the diffraction limit with near-field and evanescent-field devices. We developed an analytical photon scanning tunneling microscope (APSTM) that adds spectroscopic capabilities to one such microscope. With the APSTM we measure near-surfacestress - as well as surface topography - in ruby.
Original language | English |
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Pages (from-to) | 343-347 |
Number of pages | 5 |
Journal | Physics Letters, Section A: General, Atomic and Solid State Physics |
Volume | 145 |
Issue number | 6-7 |
DOIs | |
State | Published - Apr 23 1990 |
Externally published | Yes |
Funding
Research supported by the Precision Engineering Center of North Carolina State University through its Industrial Affiliates and the Office of Naval Research under contract N00014-86-K-0681 P-4, and by the Office of Health and Environmental Research, U.S. Department of Energy, under contract DE-ACO5-840R2 1400 with Martin Marietta Energy Systems, Inc.
Funders | Funder number |
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Office of Health and Environmental Research | |
Office of Naval Research | N00014-86-K-0681 P-4 |
U.S. Department of Energy | DE-ACO5-840R2 1400 |
North Carolina State University |