Spectroscopy in the evanescent field with an analytical photon scanning tunneling microscope

P. J. Moyer, C. L. Jahncke, M. A. Paesler, R. C. Reddick, R. J. Warmack

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Recently optical microscopic surface imaging resolution has been extended beyond the diffraction limit with near-field and evanescent-field devices. We developed an analytical photon scanning tunneling microscope (APSTM) that adds spectroscopic capabilities to one such microscope. With the APSTM we measure near-surfacestress - as well as surface topography - in ruby.

Original languageEnglish
Pages (from-to)343-347
Number of pages5
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Volume145
Issue number6-7
DOIs
StatePublished - Apr 23 1990
Externally publishedYes

Funding

Research supported by the Precision Engineering Center of North Carolina State University through its Industrial Affiliates and the Office of Naval Research under contract N00014-86-K-0681 P-4, and by the Office of Health and Environmental Research, U.S. Department of Energy, under contract DE-ACO5-840R2 1400 with Martin Marietta Energy Systems, Inc.

FundersFunder number
Office of Health and Environmental Research
Office of Naval ResearchN00014-86-K-0681 P-4
U.S. Department of EnergyDE-ACO5-840R2 1400
North Carolina State University

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