Spectroscopy in the evanescent field with an analytical photon scanning tunneling microscope

P. J. Moyer; C. L. Jahncke; M. A. Paesler; R. C. Reddick; R. J. Warmack

doi:10.1016/0375-9601(90)90946-L

Spectroscopy in the evanescent field with an analytical photon scanning tunneling microscope

P. J. Moyer, C. L. Jahncke, M. A. Paesler, R. C. Reddick, R. J. Warmack

Sensors and Electronics

Research output: Contribution to journal › Article › peer-review

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Abstract

Recently optical microscopic surface imaging resolution has been extended beyond the diffraction limit with near-field and evanescent-field devices. We developed an analytical photon scanning tunneling microscope (APSTM) that adds spectroscopic capabilities to one such microscope. With the APSTM we measure near-surfacestress - as well as surface topography - in ruby.

Original language	English
Pages (from-to)	343-347
Number of pages	5
Journal	Physics Letters, Section A: General, Atomic and Solid State Physics
Volume	145
Issue number	6-7
DOIs	https://doi.org/10.1016/0375-9601(90)90946-L
State	Published - Apr 23 1990

Funding

Research supported by the Precision Engineering Center of North Carolina State University through its Industrial Affiliates and the Office of Naval Research under contract N00014-86-K-0681 P-4, and by the Office of Health and Environmental Research, U.S. Department of Energy, under contract DE-ACO5-840R2 1400 with Martin Marietta Energy Systems, Inc.

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10.1016/0375-9601(90)90946-L

Cite this

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abstract = "Recently optical microscopic surface imaging resolution has been extended beyond the diffraction limit with near-field and evanescent-field devices. We developed an analytical photon scanning tunneling microscope (APSTM) that adds spectroscopic capabilities to one such microscope. With the APSTM we measure near-surfacestress - as well as surface topography - in ruby.",

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AU - Paesler, M. A.

AU - Reddick, R. C.

AU - Warmack, R. J.

PY - 1990/4/23

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N2 - Recently optical microscopic surface imaging resolution has been extended beyond the diffraction limit with near-field and evanescent-field devices. We developed an analytical photon scanning tunneling microscope (APSTM) that adds spectroscopic capabilities to one such microscope. With the APSTM we measure near-surfacestress - as well as surface topography - in ruby.

AB - Recently optical microscopic surface imaging resolution has been extended beyond the diffraction limit with near-field and evanescent-field devices. We developed an analytical photon scanning tunneling microscope (APSTM) that adds spectroscopic capabilities to one such microscope. With the APSTM we measure near-surfacestress - as well as surface topography - in ruby.

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Spectroscopy in the evanescent field with an analytical photon scanning tunneling microscope

Abstract

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