Abstract
The individual atom within an bulk solid was spectroscopically analyzed at atomic level with spatial resolution. It helped in detection, identification and measurement of electronic properties of single atoms. An aberration-corrected scanning transmission electron microscope was used for spectroscopic imaging of single atom, and an indication of atom depth could also be obtained through dynamical simulation of probe spreading. The simulation results confirms that the spectroscopic information was spatially confined around the scattering atom.
Original language | English |
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Article number | 095502 |
Pages (from-to) | 095502-1-095502-4 |
Journal | Physical Review Letters |
Volume | 92 |
Issue number | 9 |
DOIs | |
State | Published - Mar 5 2004 |