Abstract
The individual atom within an bulk solid was spectroscopically analyzed at atomic level with spatial resolution. It helped in detection, identification and measurement of electronic properties of single atoms. An aberration-corrected scanning transmission electron microscope was used for spectroscopic imaging of single atom, and an indication of atom depth could also be obtained through dynamical simulation of probe spreading. The simulation results confirms that the spectroscopic information was spatially confined around the scattering atom.
Original language | English |
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Article number | 095502 |
Pages (from-to) | 095502-1-095502-4 |
Journal | Physical Review Letters |
Volume | 92 |
Issue number | 9 |
DOIs | |
State | Published - Mar 5 2004 |
Funding
M. Varela acknowledges fruitful discussions with ?>R. Sanchez. This research was sponsored by the Laboratory Directed Research and Development Pro?>gram of ORNL, managed by UT-Battelle, LLC, for the U.S. Department of Energy under Contract No. DE-AC05-00OR22725 and by appointment to the ORNL Postdoctoral Research Program administered jointly by ORNL and ORISE. M. P. Oxley and L. J. Allen acknowledge support by the Australian Research Council.
Funders | Funder number |
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U.S. Department of Energy | DE-AC05-00OR22725 |
Oak Ridge National Laboratory | |
Oak Ridge Institute for Science and Education | |
Laboratory Directed Research and Development | |
Australian Research Council |