Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization

P. Rulis; A. R. Lupini; S. J. Pennycook; W. Y. Ching

doi:10.1016/j.ultramic.2009.08.004

Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization

P. Rulis
, A. R. Lupini
, S. J. Pennycook
, W. Y. Ching

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

We have devised a technique for spectral imaging using accurate ab initio electron energy loss near edge structure (ELNES) data and function field visualization. The technique is initially applied to a planar defect model in Si with different ring structures and no broken bonds where experimental probes are severely limited. The same model with B doping is also considered. It is shown that specific deviations in different energy ranges of the ELNES spectra are correlated with different structural components of the models.

Original language	English
Pages (from-to)	1472-1478
Number of pages	7
Journal	Ultramicroscopy
Volume	109
Issue number	12
DOIs	https://doi.org/10.1016/j.ultramic.2009.08.004
State	Published - Nov 2009

Funding

This work was supported by the US Department of Energy under Grant no. DE-FG02-84DR45170 . This research used the resources of NERSC supported by the Office of Science of DOE under contract no. DE-AC03-76SF00098 and the University of Missouri Bioinformatics Consortium. Research sponsored by the Division of Materials Sciences and Engineering, US Department of Energy (ARL, SJP).

Keywords

Ab initio
EELS
ELNES
Si defect
Spectral imaging

Access to Document

10.1016/j.ultramic.2009.08.004

Cite this

@article{e3a539e7e5ed4ec5b67d0045ce84c05f,

title = "Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization",

abstract = "We have devised a technique for spectral imaging using accurate ab initio electron energy loss near edge structure (ELNES) data and function field visualization. The technique is initially applied to a planar defect model in Si with different ring structures and no broken bonds where experimental probes are severely limited. The same model with B doping is also considered. It is shown that specific deviations in different energy ranges of the ELNES spectra are correlated with different structural components of the models.",

keywords = "Ab initio, EELS, ELNES, Si defect, Spectral imaging",

author = "P. Rulis and Lupini, \{A. R.\} and Pennycook, \{S. J.\} and Ching, \{W. Y.\}",

year = "2009",

month = nov,

doi = "10.1016/j.ultramic.2009.08.004",

language = "English",

volume = "109",

pages = "1472--1478",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "12",

}

TY - JOUR

T1 - Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization

AU - Rulis, P.

AU - Lupini, A. R.

AU - Pennycook, S. J.

AU - Ching, W. Y.

PY - 2009/11

Y1 - 2009/11

N2 - We have devised a technique for spectral imaging using accurate ab initio electron energy loss near edge structure (ELNES) data and function field visualization. The technique is initially applied to a planar defect model in Si with different ring structures and no broken bonds where experimental probes are severely limited. The same model with B doping is also considered. It is shown that specific deviations in different energy ranges of the ELNES spectra are correlated with different structural components of the models.

AB - We have devised a technique for spectral imaging using accurate ab initio electron energy loss near edge structure (ELNES) data and function field visualization. The technique is initially applied to a planar defect model in Si with different ring structures and no broken bonds where experimental probes are severely limited. The same model with B doping is also considered. It is shown that specific deviations in different energy ranges of the ELNES spectra are correlated with different structural components of the models.

KW - Ab initio

KW - EELS

KW - ELNES

KW - Si defect

KW - Spectral imaging

UR - https://www.scopus.com/pages/publications/70349962922

U2 - 10.1016/j.ultramic.2009.08.004

DO - 10.1016/j.ultramic.2009.08.004

M3 - Article

AN - SCOPUS:70349962922

SN - 0304-3991

VL - 109

SP - 1472

EP - 1478

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 12

ER -

Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization

Abstract

Funding

Keywords

Access to Document

Other files and links

Fingerprint

Cite this