Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization

P. Rulis, A. R. Lupini, S. J. Pennycook, W. Y. Ching

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We have devised a technique for spectral imaging using accurate ab initio electron energy loss near edge structure (ELNES) data and function field visualization. The technique is initially applied to a planar defect model in Si with different ring structures and no broken bonds where experimental probes are severely limited. The same model with B doping is also considered. It is shown that specific deviations in different energy ranges of the ELNES spectra are correlated with different structural components of the models.

Original languageEnglish
Pages (from-to)1472-1478
Number of pages7
JournalUltramicroscopy
Volume109
Issue number12
DOIs
StatePublished - Nov 2009

Funding

This work was supported by the US Department of Energy under Grant no. DE-FG02-84DR45170 . This research used the resources of NERSC supported by the Office of Science of DOE under contract no. DE-AC03-76SF00098 and the University of Missouri Bioinformatics Consortium. Research sponsored by the Division of Materials Sciences and Engineering, US Department of Energy (ARL, SJP).

Keywords

  • Ab initio
  • EELS
  • ELNES
  • Si defect
  • Spectral imaging

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