Spectroscopic ellipsometry studies of nanocrystalline silicon in thin-film silicon dioxide

Gerald E. Jellison, Stephen P. Withrow, Supriya Jaiswal, Christopher M. Rouleau, John T. Simpson, Clark W. White, C. Owen Griffiths

Research output: Contribution to journalConference articlepeer-review

Fingerprint

Dive into the research topics of 'Spectroscopic ellipsometry studies of nanocrystalline silicon in thin-film silicon dioxide'. Together they form a unique fingerprint.

Material Science