Spectral linewidth measurement of an injection-seeded transient 18.9 nm Soft X-ray laser

D. Alessi, L. M. Meng, Y. Wang, O. Guilbaud, M. Berrill, S. R. Domingue, D. H. Martz, B. M. Luther, D. Joyeux, S. De Rossi, A. Klisnick, J. J. Rocca

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The linewidth of an injection-seeded 18.9nm molybdenum soft x-ray laser (SXRL) was measured to be significantly wider than seeded optical field ionization SXRLs that use gaseous targets, an advantage for the development of sub-picosecond SXRLs.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2011
StatePublished - 2011
Externally publishedYes
EventQuantum Electronics and Laser Science Conference, QELS 2011 - Baltimore, MD, United States
Duration: May 1 2011May 6 2011

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceQuantum Electronics and Laser Science Conference, QELS 2011
Country/TerritoryUnited States
CityBaltimore, MD
Period05/1/1105/6/11

Fingerprint

Dive into the research topics of 'Spectral linewidth measurement of an injection-seeded transient 18.9 nm Soft X-ray laser'. Together they form a unique fingerprint.

Cite this