Spatially resolved probing of Preisach density in polycrystalline ferroelectric thin films

S. Guo; O. S. Ovchinnikov; M. E. Curtis; M. B. Johnson; S. Jesse; S. V. Kalinin

doi:10.1063/1.3493738

Spatially resolved probing of Preisach density in polycrystalline ferroelectric thin films

S. Guo, O. S. Ovchinnikov, M. E. Curtis, M. B. Johnson, S. Jesse, S. V. Kalinin

Center for Nanophase Matls Sciences

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

Applications of the ferroelectric materials for the information storage necessitate the understanding of local switching behavior on the level of individual grains and microstructural elements. In particular, implementation of multilevel neuromorphic elements requires the understanding of history-dependent polarization responses. Here, we introduce the spatially resolved approach for mapping local Preisach densities in polycrystalline ferroelectrics based on first-order reversal curve (FORC) measurements over spatially resolved grid by piezoresponse force spectroscopy using tip-electrode. The band excitation approach allowed effective use of cantilever resonances to amplify weak piezoelectric signal and also provided insight in position-, voltage-, and voltage history-dependent mechanical properties of the tip-surface contact. Several approaches for visualization and comparison of the multidimensional data sets formed by FORC families or Preisach densities at each point are introduced and compared. The relationship between switching behavior and microstructure is analyzed.

Original language	English
Article number	084103
Journal	Journal of Applied Physics
Volume	108
Issue number	8
DOIs	https://doi.org/10.1063/1.3493738
State	Published - Oct 15 2010

Funding

The work is supported at the Center for Nanophase Materials Sciences by the Division of the Scientific User Facilities, U.S. DOE. M.E.C. and M.B.J. would like to acknowledge support from an NSF-SIA/NRI supplement to the center for Semiconductor Physics in Nanostructures (C-SPIN), the Oklahoma/Arkansas MRSEC Grant No. DMR-0520550 that initiated and funded a collaboration between C-SPIN and Texas Instruments. Furthermore M.E.C. and M.B.J. would like to thank K. R. Udayakumar, G. D. Lian, and J. Chung for ferroelectric samples, TEM sample preparation and TEM work and discussions.

Funders	Funder number
Center for Nanophase Materials Sciences
NSF-SIA
Oklahoma/Arkansas MRSEC	DMR-0520550
U.S. Department of Energy
Niroo Research Institute

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Spatially resolved probing of Preisach density in polycrystalline ferroelectric thin films

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