Spatially resolved mapping of polarization switching behavior in nanoscale ferroelectrics

Switching spectroscopy piezoresponse force microscopy (SS-PFM) was used to investigate the spatial variability of switching in ferroelectric nanoparticle arrays and within a single nanoparticle. A commercial scanning probe microscopy, equipped with additional function generators and lock-in-amplifiers was used for performing PFM measurements. A shielded tip holder was used to bias the tip directly, while measurements were performed, using Pt and Au coated tips. The local piezoelectric response was detected as the first harmonic component, when the tip was brought into contact with the surface in PFM. 2D maps of switching properties revealed a variation of switching activity, including coercive bias and imprint, electromechanical responses, and work of switching within the nanodot.