Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

Evgheni Strelcov; Stephen Jesse; Yen Lin Huang; Yung Chun Teng; Ivan I. Kravchenko; Ying Hao Chu; Sergei V. Kalinin

doi:10.1021/nn4017873

Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

Evgheni Strelcov
, Stephen Jesse
, Yen Lin Huang
, Yung Chun Teng
, Ivan I. Kravchenko
, Ying Hao Chu
, Sergei V. Kalinin

Research output: Contribution to journal › Article › peer-review

46 Scopus citations

Abstract

A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

Original language	English
Pages (from-to)	6806-6815
Number of pages	10
Journal	ACS Nano
Volume	7
Issue number	8
DOIs	https://doi.org/10.1021/nn4017873
State	Published - Aug 27 2013

Keywords

Ca-BFO
KPFM
ionic dynamics
oxygen vacancy
surface potential distribution

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10.1021/nn4017873

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title = "Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices",

abstract = "A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.",

keywords = "Ca-BFO, KPFM, ionic dynamics, oxygen vacancy, surface potential distribution",

author = "Evgheni Strelcov and Stephen Jesse and Huang, \{Yen Lin\} and Teng, \{Yung Chun\} and Kravchenko, \{Ivan I.\} and Chu, \{Ying Hao\} and Kalinin, \{Sergei V.\}",

year = "2013",

month = aug,

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doi = "10.1021/nn4017873",

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pages = "6806--6815",

journal = "ACS Nano",

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T1 - Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

AU - Strelcov, Evgheni

AU - Jesse, Stephen

AU - Huang, Yen Lin

AU - Teng, Yung Chun

AU - Kravchenko, Ivan I.

AU - Chu, Ying Hao

AU - Kalinin, Sergei V.

PY - 2013/8/27

Y1 - 2013/8/27

N2 - A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

AB - A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

KW - Ca-BFO

KW - KPFM

KW - ionic dynamics

KW - oxygen vacancy

KW - surface potential distribution

UR - https://www.scopus.com/pages/publications/84883224374

U2 - 10.1021/nn4017873

DO - 10.1021/nn4017873

M3 - Article

AN - SCOPUS:84883224374

SN - 1936-0851

VL - 7

SP - 6806

EP - 6815

JO - ACS Nano

JF - ACS Nano

IS - 8

ER -

Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

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Keywords

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