Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

Evgheni Strelcov; Stephen Jesse; Yen Lin Huang; Yung Chun Teng; Ivan I. Kravchenko; Ying Hao Chu; Sergei V. Kalinin

doi:10.1021/nn4017873

Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

Evgheni Strelcov, Stephen Jesse, Yen Lin Huang, Yung Chun Teng, Ivan I. Kravchenko, Ying Hao Chu, Sergei V. Kalinin

Research output: Contribution to journal › Article › peer-review

42 Scopus citations

Abstract

A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

Original language	English
Pages (from-to)	6806-6815
Number of pages	10
Journal	ACS Nano
Volume	7
Issue number	8
DOIs	https://doi.org/10.1021/nn4017873
State	Published - Aug 27 2013

Keywords

Ca-BFO
KPFM
ionic dynamics
oxygen vacancy
surface potential distribution

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10.1021/nn4017873

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@article{e4f2c91fb53a48a6897840bd6a0e9877,

title = "Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices",

abstract = "A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.",

keywords = "Ca-BFO, KPFM, ionic dynamics, oxygen vacancy, surface potential distribution",

author = "Evgheni Strelcov and Stephen Jesse and Huang, {Yen Lin} and Teng, {Yung Chun} and Kravchenko, {Ivan I.} and Chu, {Ying Hao} and Kalinin, {Sergei V.}",

year = "2013",

month = aug,

day = "27",

doi = "10.1021/nn4017873",

language = "English",

volume = "7",

pages = "6806--6815",

journal = "ACS Nano",

issn = "1936-0851",

publisher = "American Chemical Society",

number = "8",

}

TY - JOUR

T1 - Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

AU - Strelcov, Evgheni

AU - Jesse, Stephen

AU - Huang, Yen Lin

AU - Teng, Yung Chun

AU - Kravchenko, Ivan I.

AU - Chu, Ying Hao

AU - Kalinin, Sergei V.

PY - 2013/8/27

Y1 - 2013/8/27

N2 - A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

AB - A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

KW - Ca-BFO

KW - KPFM

KW - ionic dynamics

KW - oxygen vacancy

KW - surface potential distribution

UR - http://www.scopus.com/inward/record.url?scp=84883224374&partnerID=8YFLogxK

U2 - 10.1021/nn4017873

DO - 10.1021/nn4017873

M3 - Article

AN - SCOPUS:84883224374

SN - 1936-0851

VL - 7

SP - 6806

EP - 6815

JO - ACS Nano

JF - ACS Nano

IS - 8

ER -

Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

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Keywords

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