Solution processing of lanthanum zirconate films as single buffer layers for high Ic YBCO coated conductors

  • Srivatsan Sathyamurthy
  • , M. Parans Paranthaman
  • , Hong Ying Zhai
  • , Sukill Kang
  • , Hans M. Christen
  • , Claudia Cantoni
  • , Amit Goyal
  • , Patrick M. Martin

Research output: Contribution to journalConference articlepeer-review

26 Scopus citations

Abstract

Sol-gel processing of lanthanum zirconate (La2Zr2O7 - referred to as LZO) buffer layers on biaxially textured nickel and Ni-3 at.% W alloy substrates using spin coating and a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. This coating and annealing process was repeated to get the desired buffer layer thickness. On these all-solution single buffer layer substrates, YBCO films were grown using pulsed laser deposition process. Critical current density about 2 MA/cm2 at 77 K and self-field has been obtained on these samples. Continuous processing of these substrates and processing of high Ic YBCO films on them will be discussed.

Original languageEnglish
Pages (from-to)2658-2660
Number of pages3
JournalIEEE Transactions on Applied Superconductivity
Volume13
Issue number2 III
DOIs
StatePublished - Jun 2003
Event2002 Applied Superconductivity Conference - Houston, TX, United States
Duration: Aug 4 2002Aug 9 2002

Funding

Manuscript received August 6, 2002. The U.S. DOE, Division of Materials Sciences, Office of Science and Office of Power Technologies-Superconductivity Program, and Office of Energy Efficiency and Renewable Energy sponsored this research. This research was performed at the Oak Ridge National Laboratory, managed by UT-Battelle, LLC for the U.S. DOE under Contract DE-AC05-00OR22725.

Keywords

  • All-solution buffer layers
  • Coated conductors
  • Lanthanum zirconate
  • Single buffer layer

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