Solute diffusion in liquid nickel measured by pulsed ion beam melting

J. P. Leonard; T. J. Renk; M. O. Thompson; M. J. Aziz

doi:10.1007/s11661-004-0227-0

Solute diffusion in liquid nickel measured by pulsed ion beam melting

J. P. Leonard
, T. J. Renk
, M. O. Thompson
, M. J. Aziz

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

Measurements of home-phase diffusion coefficients for dilute tungsten and molybdenum in molten nickel were made using a pulsed ion-beam melting technique. A high-intensity beam of nitrogen ions is focused on the surface of a nickel substrate that was implanted with known concentration profiles of W and Mo. Melting of the surface to a depth of ∼1 μm allows broadening of the implant profiles while molten. Solute concentration-depth profiles were determined before and after melting using Rutherford backscattering spectrometry. Using a series of numerical simulations to estimate the melt history and diffusional broadening for mean liquid temperamres in the range 1755 to 2022 K, an effective diffusion coefficient is determined in each case by comparison to the measured depth profiles. This is found to be (2.4 ± 0.2) × 10^-5 cm²/s for W and (1.6 ± 0.4) × 10^-5 cm²/s for Mo, with an additional systematic uncertainty of ±0.5 × 10^-5 due to instmmental and surface effects.

Original language	English
Pages (from-to)	2803-2807
Number of pages	5
Journal	Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Volume	35 A
Issue number	9
DOIs	https://doi.org/10.1007/s11661-004-0227-0
State	Published - Sep 2004
Externally published	Yes

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@article{54041a2b9df6478288d7288b3015e968,

title = "Solute diffusion in liquid nickel measured by pulsed ion beam melting",

abstract = "Measurements of home-phase diffusion coefficients for dilute tungsten and molybdenum in molten nickel were made using a pulsed ion-beam melting technique. A high-intensity beam of nitrogen ions is focused on the surface of a nickel substrate that was implanted with known concentration profiles of W and Mo. Melting of the surface to a depth of ∼1 μm allows broadening of the implant profiles while molten. Solute concentration-depth profiles were determined before and after melting using Rutherford backscattering spectrometry. Using a series of numerical simulations to estimate the melt history and diffusional broadening for mean liquid temperamres in the range 1755 to 2022 K, an effective diffusion coefficient is determined in each case by comparison to the measured depth profiles. This is found to be (2.4 ± 0.2) × 10-5 cm2/s for W and (1.6 ± 0.4) × 10-5 cm2/s for Mo, with an additional systematic uncertainty of ±0.5 × 10-5 due to instmmental and surface effects.",

author = "Leonard, \{J. P.\} and Renk, \{T. J.\} and Thompson, \{M. O.\} and Aziz, \{M. J.\}",

year = "2004",

month = sep,

doi = "10.1007/s11661-004-0227-0",

language = "English",

volume = "35 A",

pages = "2803--2807",

journal = "Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science",

issn = "1073-5623",

publisher = "Springer",

number = "9",

}

TY - JOUR

T1 - Solute diffusion in liquid nickel measured by pulsed ion beam melting

AU - Leonard, J. P.

AU - Renk, T. J.

AU - Thompson, M. O.

AU - Aziz, M. J.

PY - 2004/9

Y1 - 2004/9

N2 - Measurements of home-phase diffusion coefficients for dilute tungsten and molybdenum in molten nickel were made using a pulsed ion-beam melting technique. A high-intensity beam of nitrogen ions is focused on the surface of a nickel substrate that was implanted with known concentration profiles of W and Mo. Melting of the surface to a depth of ∼1 μm allows broadening of the implant profiles while molten. Solute concentration-depth profiles were determined before and after melting using Rutherford backscattering spectrometry. Using a series of numerical simulations to estimate the melt history and diffusional broadening for mean liquid temperamres in the range 1755 to 2022 K, an effective diffusion coefficient is determined in each case by comparison to the measured depth profiles. This is found to be (2.4 ± 0.2) × 10-5 cm2/s for W and (1.6 ± 0.4) × 10-5 cm2/s for Mo, with an additional systematic uncertainty of ±0.5 × 10-5 due to instmmental and surface effects.

AB - Measurements of home-phase diffusion coefficients for dilute tungsten and molybdenum in molten nickel were made using a pulsed ion-beam melting technique. A high-intensity beam of nitrogen ions is focused on the surface of a nickel substrate that was implanted with known concentration profiles of W and Mo. Melting of the surface to a depth of ∼1 μm allows broadening of the implant profiles while molten. Solute concentration-depth profiles were determined before and after melting using Rutherford backscattering spectrometry. Using a series of numerical simulations to estimate the melt history and diffusional broadening for mean liquid temperamres in the range 1755 to 2022 K, an effective diffusion coefficient is determined in each case by comparison to the measured depth profiles. This is found to be (2.4 ± 0.2) × 10-5 cm2/s for W and (1.6 ± 0.4) × 10-5 cm2/s for Mo, with an additional systematic uncertainty of ±0.5 × 10-5 due to instmmental and surface effects.

UR - https://www.scopus.com/pages/publications/6944229548

U2 - 10.1007/s11661-004-0227-0

DO - 10.1007/s11661-004-0227-0

M3 - Article

AN - SCOPUS:6944229548

SN - 1073-5623

VL - 35 A

SP - 2803

EP - 2807

JO - Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

JF - Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

IS - 9

ER -

Solute diffusion in liquid nickel measured by pulsed ion beam melting

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