Soft-Switching Characterization of 3.3 kV Reverse-blocking SiC Devices

Xiangyu Han, Rajendra Prasad Kandula, Karthik Kandasamy, Deepak Divan, Maryam Saeedifard

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

This paper presents device characterization results for 3.3 kV reverse-blocking Silicon Carbide (SiC) devices under Zero Voltage Switching (ZVS) conditions. A novel double-pulse test circuit to test the reverse blocking switches under soft switching conditions is proposed. The results from hard switching and soft switching are compared to highlight the effectiveness and necessity of soft switching when using 3.3 kV reverse-blocking devices. The paper also analyzes the impact of parasitic inductances and capacitances on switching performance of 3.3 kV SiC devices. The double-pulse test circuit, operating principle, experimental characterization results for a custom-built 3.3 kV reverse blocking module, and parasitic parameters extraction are presented.

Original languageEnglish
Title of host publication2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages185-191
Number of pages7
ISBN (Electronic)9781538659090
DOIs
StatePublished - Dec 7 2018
Externally publishedYes
Event6th Annual IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018 - Atlanta, United States
Duration: Oct 31 2018Nov 2 2018

Publication series

Name2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018

Conference

Conference6th Annual IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018
Country/TerritoryUnited States
CityAtlanta
Period10/31/1811/2/18

Funding

ACKNOWLEDGMENT The authors are grateful for financial support provided by Power America and Center for Distributed Energy (CDE) at Georgia Tech for this work.

FundersFunder number
Power America and Center for Distributed Energy
California Department of Education

    Keywords

    • double pulse test
    • reverse-blocking devices
    • soft-switching

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