TY - GEN
T1 - Soft-Switching Characterization of 3.3 kV Reverse-blocking SiC Devices
AU - Han, Xiangyu
AU - Kandula, Rajendra Prasad
AU - Kandasamy, Karthik
AU - Divan, Deepak
AU - Saeedifard, Maryam
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/12/7
Y1 - 2018/12/7
N2 - This paper presents device characterization results for 3.3 kV reverse-blocking Silicon Carbide (SiC) devices under Zero Voltage Switching (ZVS) conditions. A novel double-pulse test circuit to test the reverse blocking switches under soft switching conditions is proposed. The results from hard switching and soft switching are compared to highlight the effectiveness and necessity of soft switching when using 3.3 kV reverse-blocking devices. The paper also analyzes the impact of parasitic inductances and capacitances on switching performance of 3.3 kV SiC devices. The double-pulse test circuit, operating principle, experimental characterization results for a custom-built 3.3 kV reverse blocking module, and parasitic parameters extraction are presented.
AB - This paper presents device characterization results for 3.3 kV reverse-blocking Silicon Carbide (SiC) devices under Zero Voltage Switching (ZVS) conditions. A novel double-pulse test circuit to test the reverse blocking switches under soft switching conditions is proposed. The results from hard switching and soft switching are compared to highlight the effectiveness and necessity of soft switching when using 3.3 kV reverse-blocking devices. The paper also analyzes the impact of parasitic inductances and capacitances on switching performance of 3.3 kV SiC devices. The double-pulse test circuit, operating principle, experimental characterization results for a custom-built 3.3 kV reverse blocking module, and parasitic parameters extraction are presented.
KW - double pulse test
KW - reverse-blocking devices
KW - soft-switching
UR - http://www.scopus.com/inward/record.url?scp=85060246856&partnerID=8YFLogxK
U2 - 10.1109/WiPDA.2018.8569199
DO - 10.1109/WiPDA.2018.8569199
M3 - Conference contribution
AN - SCOPUS:85060246856
T3 - 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018
SP - 185
EP - 191
BT - 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 6th Annual IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2018
Y2 - 31 October 2018 through 2 November 2018
ER -