SnO2-gated AlGaN/GaN high electron mobility transistors based oxygen sensors

Shao Tsu Hung, Chi Jung Chang, Chin Ching Chen, Chien Fong Lo, Fan Ren, Stephen J. Pearton, Ivan I. Kravchenko

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Abstract

Hydrothermally grown SnO2 was integrated with AlGaN/GaN high electron mobility transistor (HEMT) sensor as the gate electrode for oxygen detection. The crystalline of the SnO2 was improved after annealing at 400 °C. The grain growth kinetics of the SnO2 nanomaterials, together with the O2 gas sensing properties and sensing mechanism of the SnO2 gated HEMT sensors were investigated. Detection of 1% oxygen in nitrogen at 100 °C was possible. A low operation temperature and low power consumption oxygen sensor can be achieved by combining the SnO2 films with the AlGaN/GaN HEMT structure.

Original languageEnglish
Article number041214
JournalJournal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
Volume30
Issue number4
DOIs
StatePublished - Jul 2012

Funding

The work at UF was partially supported by the Office of Naval Research (ONR) under Contract No. 00075094 monitored by Chagaan Baatar and NSF (J. M. Zavada). A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. The work at FCU was supported by the National Science Council (NSC) of Taiwan under Contract No. NSC 100-2628-E-035-003. The authors are also thankful for the assistance from the Precision Instrument Support Center of Feng Chia University.

FundersFunder number
Chagaan Baatar
Office of Basic Energy Sciences
Scientific User Facilities Division
National Science Foundation1159682
Office of Naval Research00075094
U.S. Department of Energy
Oak Ridge National Laboratory
National Science Council

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