Single frequency characterization of a commercial resin

Enis Tuncer; Isidor Sauers; D. Randy James; Alvin R. Ellis; Georgios Polizos; Marshall O. Pace

doi:10.1109/CEIDP.2009.5377751

Single frequency characterization of a commercial resin

Enis Tuncer, Isidor Sauers, D. Randy James, Alvin R. Ellis, Georgios Polizos, Marshall O. Pace

Energy Storage and Conversion Manufactur

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Electrical impedance measurement methods are extensively utilized to characterize dielectric materials. There are not many inexpensive commercially available measurement systems for low frequencies. In this paper an impedance measurement method using an electrometer is presented. The method can be employed for frequencies lower than 100 mHz. To illustrate the usefulness of the presented method, an epoxy resin is characterized and the influence of thermal aging is investigated.

Original language	English
Title of host publication	CEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena
Pages	158-160
Number of pages	3
DOIs	https://doi.org/10.1109/CEIDP.2009.5377751
State	Published - 2009
Event	2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Virginia Beach, VA, United States Duration: Oct 18 2009 → Oct 21 2009

Publication series

Name	Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
ISSN (Print)	0084-9162

Conference

Conference	2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Country/Territory	United States
City	Virginia Beach, VA
Period	10/18/09 → 10/21/09

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10.1109/CEIDP.2009.5377751

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Tuncer, E., Sauers, I., James, D. R., Ellis, A. R., Polizos, G., & Pace, M. O. (2009). Single frequency characterization of a commercial resin. In CEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (pp. 158-160). Article 5377751 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP). https://doi.org/10.1109/CEIDP.2009.5377751

@inproceedings{f0a83812a84a4797b0e401120a087541,

title = "Single frequency characterization of a commercial resin",

abstract = "Electrical impedance measurement methods are extensively utilized to characterize dielectric materials. There are not many inexpensive commercially available measurement systems for low frequencies. In this paper an impedance measurement method using an electrometer is presented. The method can be employed for frequencies lower than 100 mHz. To illustrate the usefulness of the presented method, an epoxy resin is characterized and the influence of thermal aging is investigated.",

author = "Enis Tuncer and Isidor Sauers and James, \{D. Randy\} and Ellis, \{Alvin R.\} and Georgios Polizos and Pace, \{Marshall O.\}",

year = "2009",

doi = "10.1109/CEIDP.2009.5377751",

language = "English",

isbn = "9781424445592",

series = "Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP",

pages = "158--160",

booktitle = "CEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena",

note = "2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP ; Conference date: 18-10-2009 Through 21-10-2009",

}

Tuncer, E, Sauers, I, James, DR, Ellis, AR, Polizos, G & Pace, MO 2009, Single frequency characterization of a commercial resin. in CEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena., 5377751, Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, pp. 158-160, 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, Virginia Beach, VA, United States, 10/18/09. https://doi.org/10.1109/CEIDP.2009.5377751

Single frequency characterization of a commercial resin. / Tuncer, Enis; Sauers, Isidor; James, D. Randy et al.
CEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena. 2009. p. 158-160 5377751 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Single frequency characterization of a commercial resin

AU - Tuncer, Enis

AU - Sauers, Isidor

AU - James, D. Randy

AU - Ellis, Alvin R.

AU - Polizos, Georgios

AU - Pace, Marshall O.

PY - 2009

Y1 - 2009

N2 - Electrical impedance measurement methods are extensively utilized to characterize dielectric materials. There are not many inexpensive commercially available measurement systems for low frequencies. In this paper an impedance measurement method using an electrometer is presented. The method can be employed for frequencies lower than 100 mHz. To illustrate the usefulness of the presented method, an epoxy resin is characterized and the influence of thermal aging is investigated.

AB - Electrical impedance measurement methods are extensively utilized to characterize dielectric materials. There are not many inexpensive commercially available measurement systems for low frequencies. In this paper an impedance measurement method using an electrometer is presented. The method can be employed for frequencies lower than 100 mHz. To illustrate the usefulness of the presented method, an epoxy resin is characterized and the influence of thermal aging is investigated.

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U2 - 10.1109/CEIDP.2009.5377751

DO - 10.1109/CEIDP.2009.5377751

M3 - Conference contribution

AN - SCOPUS:77949304132

SN - 9781424445592

T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

SP - 158

EP - 160

BT - CEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

T2 - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Y2 - 18 October 2009 through 21 October 2009

ER -

Single frequency characterization of a commercial resin

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