Single event effects test facility options at the Oak Ridge National Laboratory

Bernie Riemer; Franz Gallmeier; Laura Dominik

doi:10.1109/DASC.2015.7311642

Single event effects test facility options at the Oak Ridge National Laboratory

Bernie Riemer, Franz Gallmeier, Laura Dominik

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	34th Digital Avionics Systems Conference, DASC 2015
Subtitle of host publication	Impact of Global Mandates on Avionics Research and Development
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781479989409
DOIs	https://doi.org/10.1109/DASC.2015.7311642
State	Published - Oct 28 2015
Externally published	Yes
Event	34th Digital Avionics Systems Conference, DASC 2015 - Prague, Czech Republic Duration: Sep 13 2015 → Sep 17 2015

Publication series

Name	AIAA/IEEE Digital Avionics Systems Conference - Proceedings
ISSN (Print)	2155-7195
ISSN (Electronic)	2155-7209

Conference

Conference	34th Digital Avionics Systems Conference, DASC 2015
Country/Territory	Czech Republic
City	Prague
Period	09/13/15 → 09/17/15

Access to Document

10.1109/DASC.2015.7311642

Cite this

Riemer, B., Gallmeier, F., & Dominik, L. (2015). Single event effects test facility options at the Oak Ridge National Laboratory. In 34th Digital Avionics Systems Conference, DASC 2015: Impact of Global Mandates on Avionics Research and Development Article 7311642 (AIAA/IEEE Digital Avionics Systems Conference - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DASC.2015.7311642

Riemer, Bernie ; Gallmeier, Franz ; Dominik, Laura. / Single event effects test facility options at the Oak Ridge National Laboratory. 34th Digital Avionics Systems Conference, DASC 2015: Impact of Global Mandates on Avionics Research and Development. Institute of Electrical and Electronics Engineers Inc., 2015. (AIAA/IEEE Digital Avionics Systems Conference - Proceedings).

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doi = "10.1109/DASC.2015.7311642",

language = "English",

series = "AIAA/IEEE Digital Avionics Systems Conference - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Riemer, B, Gallmeier, F & Dominik, L 2015, Single event effects test facility options at the Oak Ridge National Laboratory. in 34th Digital Avionics Systems Conference, DASC 2015: Impact of Global Mandates on Avionics Research and Development., 7311642, AIAA/IEEE Digital Avionics Systems Conference - Proceedings, Institute of Electrical and Electronics Engineers Inc., 34th Digital Avionics Systems Conference, DASC 2015, Prague, Czech Republic, 09/13/15. https://doi.org/10.1109/DASC.2015.7311642

Single event effects test facility options at the Oak Ridge National Laboratory. / Riemer, Bernie; Gallmeier, Franz; Dominik, Laura.
34th Digital Avionics Systems Conference, DASC 2015: Impact of Global Mandates on Avionics Research and Development. Institute of Electrical and Electronics Engineers Inc., 2015. 7311642 (AIAA/IEEE Digital Avionics Systems Conference - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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U2 - 10.1109/DASC.2015.7311642

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M3 - Conference contribution

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Riemer B, Gallmeier F, Dominik L. Single event effects test facility options at the Oak Ridge National Laboratory. In 34th Digital Avionics Systems Conference, DASC 2015: Impact of Global Mandates on Avionics Research and Development. Institute of Electrical and Electronics Engineers Inc. 2015. 7311642. (AIAA/IEEE Digital Avionics Systems Conference - Proceedings). doi: 10.1109/DASC.2015.7311642

Single event effects test facility options at the Oak Ridge National Laboratory

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