Single buffer layer technology for YBCO coated conductors

M. Parans Paranthaman, T. Aytug, H. Y. Zhai, S. Sathyamurthy, H. M. Christen, P. M. Martin, D. K. Christen, R. E. Erickson, C. L. Thomas

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

In an effort to develop alternative single buffer layer technology for YBa2Cu3O7-δ (YBCO) coated conductors, we have investigated LaMnO3 (LMO) as a potential buffer layer. High-quality LMO films were grown directly on biaxially textured Ni and Ni-W (3%) substrates using rf magnetron sputtering. YBCO films were then grown on LMO buffers using pulsed laser deposition. Detailed X-ray studies have shown that both YBCO and LMO layers were grown with a single epitaxial orientation. Rutherford backscattering spectroscopy (RBS) analyses have indicated the ratio of La to Mn ratio is 1:1. SEM micrographs indicated that 3000-Å-thick LMO films on biaxially textured Ni (100) substrates were dense, continuous and crack-free. A high Jc of over 1 MA/cm2 at 77 K and self-field was obtained on YBCO films grown on LMO-buffered Ni or Ni-W substrates. We have identified LaMnO3 as a good diffusion barrier layer for Ni and it also provides a good template for growing high current density YBCO films.

Original languageEnglish
Pages (from-to)323-328
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume689
StatePublished - 2002

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