Simultaneous mapping of nanoscale dielectric, electrochemical, and ferroelectric surface properties of van der Waals layered ferroelectric via advanced SPM

M. Checa, S. M. Neumayer, M. A. Susner, M. A. McGuire, P. Maksymovych, L. Collins

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

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